Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...
One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.
STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...
The huge number of ICs used in today’s electronic products is difficult to comprehend, and each one has to be tested. Traditionally, testing starts at the wafer level to determine gross defects. By ...
Vertical-Cavity Surface-Emitting Lasers, or VCSELs, are seeing unparalleled demand, thanks to new uses for them in smartphone and automotive applications. 3D sensing for facial recognition is the key ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
The Ohm-Stat RT-1000 from Static Solutions tests the resisitivity, humidity and temperature of all conductive, antistatic and static-dissipative surfaces for ...
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