Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
Steven Kawamoto, Sr. Marketing Manager, Custom LSI Solutions Unit, Gaku Ogura, Sr. Marketing Manager, Design Solutions Center, Richard Lee, Design Engineer, Design ...
New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...
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